KST | EEST Athens |
CEST (CET) Paris |
UTC | EDT New York |
PDT Los Angeles |
Program at a Glance Program Details
Click the session code to see detailed schedules.
Last update : November 13, 2023 (KST)
Nov. 19 (Sun.) |
Time | Room A (Capri Room, 2F) | Room E (Sydney Room, 2F) | 2F Lobby |
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15:00-18:00 | Tutorial 1 - Korean Only | Tutorial 2 - Korean Only | ||
Memory Process and Materials Technology: DRAM, NAND, Emerging Memory Dr. Jeongdong Choe (Techlnsights, Canada) |
Atomic Layer Deposition and Area-Selective Deposition
in Semiconductor Process Prof. Il-Kwon Oh (Ajou Univ., Korea) |
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18:00-18:30 | Break | |||
18:30-20:00 | Welcome Reception (Sicily Room, 1F) |
Plenary Session will be live streamed at Sydney Room (2F) and Sicily Room (1F).
Nov. 20 (Mon.) |
Time | Room A (Capri Room, 2F) |
Room B (Grand Ballroom 1, 2F) |
Room C (Grand Ballroom 2, 2F) |
Room D (Grand Ballroom 3, 2F) |
Room E (Sydney Room, 2F) |
Room F (Sicily Room, 1F) |
2F Lobby |
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10:00-10:45 | Plenary Session I (Capri Room, 2F) "Memory Technology Innovation for the New AI Era" SVP. Ilsup Jin (SK hynix, Korea) |
Exhibition | ||||||
10:45-11:00 | Coffee Break (2F Lobby) | |||||||
11:00-11:30 | Opening Ceremony (Grand Ballroom 1, 2, 3, 2F) | |||||||
11:30-13:00 | Lunch | |||||||
13:00-14:40 | MA1 | MB1 | MC1 | MD1 | ME1 | MF1 | ||
Advanced Atomic Scale Thin Films Ⅰ | Power Device I | Advanced Ceria-Abrasive Based CMP | Novel Etch Technology | EUV Lithography I | Frontier Metrology and Modeling I | |||
14:40-14:55 | Coffee Break (2F Lobby) | |||||||
14:55-16:35 | MA2 | MB2 | MC2 | MD2 | ME2 | MF2 | ||
Advanced Atomic Scale Thin Films Ⅱ | Power Device II | CMP Challenges for the Next Generation Devices | Plasma-Surface Interaction | EUV Lithography II | Frontier Metrology and Modeling II | |||
16:35-16:50 | Coffee Break (2F Lobby) | |||||||
16:50-17:40 | Poster Session I (Grand Ballroom 4, 2F) |
Nov. 21 (Tue.) |
Time | Room A (Capri Room, 2F) |
Room B (Grand Ballroom 1, 2F) |
Room C (Grand Ballroom 2, 2F) |
Room D (Grand Ballroom 3, 2F) |
Room E (Sydney Room, 2F) |
Room F (Sicily Room, 1F) |
2F Lobby |
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08:30-10:10 | TA1 | TB1 | TC1 | TD1 | TE1 | TF1 | Exhibition | |
Advanced Atomic Scale Thin Films Ⅲ | Heterogeneous Integration Device and Packaging | Challenges and Opportunities in CMP | Plasma Characterization | DTCO and Computational Lithography | Frontier Metrology and Modeling III | |||
10:10-10:20 | Coffee Break (2F Lobby) | |||||||
10:20-12:00 | TA2 | TB2 | TC2 | TD2 | TE2 | TF2 | ||
Advanced Atomic Scale Thin Films Ⅳ | Integration and Interposer | Advanced Cu and Mo CMP | Plasma/Etch Simulation | EUV Resist & Advanced Lithography for Optical Materials | Frontier Metrology and Modeling IV | |||
12:00-13:30 | Lunch | |||||||
13:30-14:15 | Plenary Session II (Capri Room, 2F) "New Precursors and Approaches to ALD and AS-ALD of Metallic Films" Prof. Mikko Ritala (Univ. of Helsinki, Finland) |
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14:15-14:25 | Coffee Break (2F Lobby) | |||||||
14:25-16:05 | TA3 | TB3 | TC3 | TD3 | TE3 | TF3 | ||
Advanced Atomic Scale Thin Films Ⅴ | Process and Equipment | CMP Innovations | HARC Etching/Green Etch Technology | EUV HVM Status and Cutting-Edge Topics in Advanced Lithography | Frontier Metrology and Modeling V | |||
16:05-18:30 | Break | |||||||
18:30-20:30 | Banquet (Grand Ballroom, 2F) |
Nov. 22 (Wed.) |
Time | Room A (Capri Room, 2F) |
Room B (Grand Ballroom 1, 2F) |
Room C (Grand Ballroom 2, 2F) |
Room D (Grand Ballroom 3, 2F) |
Room E (Sydney Room, 2F) |
Room F (Sicily Room, 1F) |
2F Lobby |
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08:30-10:10 | WA1 | WB1 | WC1 | WD1 | WE1 | WF1 | Exhibition | |
Advanced Atomic Scale Thin Films Ⅵ | Materials and Innovation | Functional Wet Etching Technology | New Materials Etching | Advanced Lithography for Future Optical Devices I | Frontier Metrology and Modeling VI | |||
10:10-10:20 | Coffee Break (2F Lobby) | |||||||
10:20-12:00 | WA2 | WC2 | WD2 | WE2 | ||||
Advanced Atomic Scale Thin Films Ⅶ | Advanced Cleaning Technology | Atomic Layer Etching/Damage-Free Etching | Advanced Lithography for Future Optical Devices II | |||||
12:00-13:30 | Lunch | |||||||
13:30-14:15 | Plenary Session III (Capri Room, 2F) "EUV Lithography in High Volume Manufacturing" Fellow, Young Seog Kang (Samsung Electronics Co., Ltd., Korea) |
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14:15-14:30 | Coffee Break (2F Lobby) | |||||||
14:30-15:20 | Poster Session II (Grand Ballroom 4, 2F) | |||||||
15:20-15:35 | Coffee Break (2F Lobby) | |||||||
15:35-16:05 | Closing Ceremony & Award Ceremony (Capri Room, 2F) |
Nov. 23 (Thu.) |
Time | Room A (Capri Room, 2F) |
Room B (Grand Ballroom 1, 2F) |
Room C (Grand Ballroom 2, 2F) |
Room D (Grand Ballroom 3, 2F) |
Room E (Sydney Room, 2F) |
Room F (Sicily Room, 1F) |
2F Lobby |
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(Half) 08:30-12:00 (Full) 08:30-17:30 |
Optional Tour |
Topic | Sessions | Poster Session | |
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1. Advanced Atomic Scale Thin Films | MA1, MA2, TA1, TA2, TA3, WA1, WA2 | Poster Session II | |
2. CMP & Post CMP Cleaning | MC1, MC2, TC1, TC2, TC3, WC1, WC2 | ||
3. Advanced Etching Technology | MD1, MD2, TD1, TD2, TD3, WD1, WD2 | ||
4. Advanced Lithography | ME1, ME2, TE1, TE2, TE3, WE1, WE2 | Poster Session I | |
5. Post Fabrication Technology and System Packaging | TB1, TB2, TB3, WB1 | ||
6. Frontier Metrology, Diagnosis, and Modeling for Nanoscale IC Integration and Emerging Device Process | MF1, MF2, TF1, TF2, TF3, WF1 | ||
7. Power Device | MB1, MB2 | ||
8. Advanced Semiconductor Technology |
How to See the Session Codes | |||||
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Day of Week | Room | Session No. | Presentation No. | Presentation Code | |
Monday | M | A | 1 | 1 | MA1-1 |
Tuesday | T | B | 2 | 2 | TB2-2 |
Wednesday | W | C | 3 | 3 | WC3-3 |
… | … |