Program at a Glance

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Program at a Glance Program Details

Click the session code to see detailed schedules.
Last update : November 13, 2023 (KST)

Nov.
19
(Sun.)
Time Room A  (Capri Room, 2F) Room E  (Sydney Room, 2F) 2F Lobby
15:00-18:00 Tutorial 1 - Korean Only Tutorial 2  - Korean Only  
Memory Process and Materials Technology:
DRAM, NAND, Emerging Memory

Dr. Jeongdong Choe (Techlnsights, Canada)
Atomic Layer Deposition and Area-Selective Deposition in Semiconductor Process
Prof. Il-Kwon Oh (Ajou Univ., Korea)
18:00-18:30 Break
18:30-20:00 Welcome Reception (Sicily Room, 1F)

Plenary Session will be live streamed at Sydney Room (2F) and Sicily Room (1F).

Nov.
20
(Mon.)
Time Room A
(Capri Room, 2F)
Room B
(Grand Ballroom 1, 2F)
Room C
(Grand Ballroom 2, 2F)
Room D
(Grand Ballroom 3, 2F)
Room E
(Sydney Room, 2F)
Room F
(Sicily Room, 1F)
2F Lobby
10:00-10:45 Plenary Session I (Capri Room, 2F)
"Memory Technology Innovation for the New AI Era"
SVP. Ilsup Jin (SK hynix, Korea)
Exhibition
10:45-11:00 Coffee Break (2F Lobby)
11:00-11:30 Opening Ceremony (Grand Ballroom 1, 2, 3, 2F)
11:30-13:00 Lunch
13:00-14:40 MA1 MB1 MC1 MD1 ME1 MF1
Advanced Atomic Scale Thin Films Ⅰ Power Device I Advanced Ceria-Abrasive Based CMP  Novel Etch Technology EUV Lithography I Frontier Metrology and Modeling I
14:40-14:55 Coffee Break (2F Lobby)
14:55-16:35 MA2 MB2 MC2 MD2 ME2 MF2
Advanced Atomic Scale Thin Films Ⅱ Power Device II CMP Challenges for the Next Generation Devices  Plasma-Surface Interaction  EUV Lithography II Frontier Metrology and Modeling II
16:35-16:50 Coffee Break (2F Lobby)
16:50-17:40 Poster Session I (Grand Ballroom 4, 2F)
Nov.
21
(Tue.)
Time Room A
(Capri Room, 2F)
Room B
(Grand Ballroom 1, 2F)
Room C
(Grand Ballroom 2, 2F)
Room D
(Grand Ballroom 3, 2F)
Room E
(Sydney Room, 2F)
Room F
(Sicily Room, 1F)
2F Lobby
08:30-10:10 TA1 TB1 TC1 TD1 TE1 TF1 Exhibition
Advanced Atomic Scale Thin Films Ⅲ Heterogeneous Integration Device and Packaging Challenges and Opportunities in CMP Plasma Characterization  DTCO and Computational Lithography Frontier Metrology and Modeling III
10:10-10:20 Coffee Break (2F Lobby)
10:20-12:00 TA2 TB2 TC2 TD2 TE2 TF2
Advanced Atomic Scale Thin Films Ⅳ Integration and Interposer Advanced Cu and Mo CMP Plasma/Etch Simulation EUV Resist & Advanced Lithography for Optical Materials Frontier Metrology and Modeling IV
12:00-13:30 Lunch
13:30-14:15 Plenary Session II (Capri Room, 2F)
"New Precursors and Approaches to ALD and AS-ALD of Metallic Films"
Prof. Mikko Ritala (Univ. of Helsinki, Finland)
14:15-14:25 Coffee Break (2F Lobby)
14:25-16:05 TA3 TB3 TC3 TD3 TE3 TF3
Advanced Atomic Scale Thin Films Ⅴ Process and Equipment CMP Innovations HARC Etching/Green Etch Technology  EUV HVM Status and Cutting-Edge Topics in Advanced Lithography Frontier Metrology and Modeling V
16:05-18:30 Break
18:30-20:30 Banquet (Grand Ballroom, 2F)
Nov.
22
(Wed.)
Time Room A
(Capri Room, 2F)
Room B
(Grand Ballroom 1, 2F)
Room C
(Grand Ballroom 2, 2F)
Room D
(Grand Ballroom 3, 2F)
Room E
(Sydney Room, 2F)
Room F
(Sicily Room, 1F)
2F Lobby
08:30-10:10 WA1 WB1 WC1 WD1 WE1 WF1 Exhibition
Advanced Atomic Scale Thin Films Ⅵ Materials and Innovation Functional Wet Etching Technology New Materials Etching Advanced Lithography for Future Optical Devices I Frontier Metrology and Modeling VI
10:10-10:20 Coffee Break (2F Lobby)
10:20-12:00 WA2 WC2 WD2 WE2
Advanced Atomic Scale Thin Films Ⅶ Advanced Cleaning Technology Atomic Layer Etching/Damage-Free Etching Advanced Lithography for Future Optical Devices II
12:00-13:30 Lunch
13:30-14:15 Plenary Session III (Capri Room, 2F)
"EUV Lithography in High Volume Manufacturing"
Fellow, Young Seog Kang (Samsung Electronics Co., Ltd., Korea)
14:15-14:30 Coffee Break (2F Lobby)
14:30-15:20 Poster Session II (Grand Ballroom 4, 2F)
15:20-15:35 Coffee Break (2F Lobby)
15:35-16:05 Closing Ceremony & Award Ceremony (Capri Room, 2F)
Nov.
23
(Thu.)
Time Room A
(Capri Room, 2F)
Room B
(Grand Ballroom 1, 2F)
Room C
(Grand Ballroom 2, 2F)
Room D
(Grand Ballroom 3, 2F)
Room E
(Sydney Room, 2F)
Room F
(Sicily Room, 1F)
2F Lobby
(Half)
08:30-12:00
(Full)
08:30-17:30
Optional Tour
Topic Sessions Poster Session
1. Advanced Atomic Scale Thin Films MA1, MA2, TA1, TA2, TA3, WA1, WA2 Poster Session II
2. CMP & Post CMP Cleaning MC1, MC2, TC1, TC2, TC3, WC1, WC2
3. Advanced Etching Technology MD1, MD2, TD1, TD2, TD3, WD1, WD2
4. Advanced Lithography ME1, ME2, TE1, TE2, TE3, WE1, WE2 Poster Session I
5. Post Fabrication Technology and System Packaging TB1, TB2, TB3, WB1
6. Frontier Metrology, Diagnosis, and Modeling for Nanoscale IC Integration and Emerging Device Process MF1, MF2, TF1, TF2, TF3, WF1
7. Power Device MB1, MB2
8. Advanced Semiconductor Technology
How to See the Session Codes
Day of Week Room Session No. Presentation No. Presentation Code
Monday M A 1 1 MA1-1
Tuesday T B 2 2 TB2-2
Wednesday W C 3 3 WC3-3
       

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